方向光谱发射率测量装置的研制及其解析模型的建立

The accurate directional spectral emissivity plays a crucial role in photovoltaic materials, remote sensing, aeronautics and astronautics, and so forth. There are different kinds of methods for measuring spectral emissivity, and the function of measurement apparatuses is very different. The measurement apparatus of directional spectral emissivity are rare. To meet the increasing demand of high precision directional spectral emissivity measurement in technological field, a directional spectral emissivity measurement apparatus with distinctive feature is developed by elliptical features in this project. The research mainly includes several parts, a new method of measuring directional radiation for spectral emissivity and other optical measurement is proposed by designing a kind of automatically adjusted optical system. Based on reflection measurement method, the surface temperature of the specimen is measured precisely by the clever design. The sample heater, blackbody furnace and other critical component are designed. The problems in the integration and automatic control of the measurement system are solved. In order to research the change rule of the spectral emissivity and develop mathematical models, the directional spectral emissivity of various materials will be measured by the measurement apparatus. The research result would provide new mode for the application of the direction spectral emissivity. The project would not only develop a new directional spectral measurement method, but would provide the date of directional spectral emissivity. And the analytical model for technical application and scientific research field would be established by studying the variation of the directional spectral emissivity.

精确的方向光谱发射率数据在光伏材料、航空航天、遥感等技术领域有着重要的应用。光谱发射率测量方法多，测量装置功能各异，能够实现方向光谱发射率测量的装置较少。项目针对日益增长的对方向光谱发射率数据的需求，利用椭球的特殊结构，研制一套具有鲜明特色的方向光谱发射率测量装置。其主要研究包括以下几个方面，通过设计一种角度能够连续可调的全自动光学调整系统，为方向光谱发射率测量技术及其他光学测量系统提供一种测量方向辐射的新方法；通过巧妙的设计，基于反射法原理解决表面精确测温的难题；设计样品加热体、黑体炉等关键部件，解决系统的集成化和自动化控制问题；测量多种材料的方向光谱发射率，研究光谱发射率随方向的变化规律，并建立相应的数学模型，为方向光谱发射率的应用提供新模型。项目不仅为方向发射率的测量提供了一种新的测量方法，而且通过研究材料的方向变化规律，为技术应用和科研领域提供方向光谱发射率数据和解析模型。

材料的表面光谱发射率与测量方向有较大的关系，方向光谱发射率在太阳能、遥感等领域有着重要的应用。该项目主要针对方向光谱发射率难以精确测量的难题开展研究。项目在总结前期方向光谱发射率测量的基础之上，提出了一种新的高精度方向光谱发射率测量方法，设计并搭建了方向光谱发射率测量装置。针对该测量装置，通过测量对比，研究减小环境辐射、源尺寸效应影响的方法，实现了方向光谱发射率的精确测量。样品表面温度是影响光谱发射率测量不确定度的主要因素之一，项目针对该问题，从测温方法、加热装置及标准黑体三方面入手，提出了一种新的测温方法，减小加热装置和黑体温度的差异，从根本上提高了红外辐射测量的精度，实现了固体样品100-1200℃的快速加热及精确控温。该装置可以实现固体样品0-85°方向光谱发射率的测量，角度调整精度为0.1°，测量装置的整体不确定度优于3%。实现了光谱发射率测量系统的集成与控制。利用搭建的光谱发射率测量装置对碳化硅、铜、钛合金、钴等材料的方向光谱发射率进行了系统的研究，特别是系统的对钛合金的方向光谱发射率进行系统的分析和总结，重点对光谱发射率与方向、温度、波长之间的变化规律进行分析，并于国际上报道的光谱发射率进行了对比，证明了实验装置的可靠性。通过该项目研究，不仅搭建了相关的方向光谱发射率测量装置，而且还获得了大量的方向光谱发射率数据。该项目研究成果在太阳能面板性能测试、材料隐身性能测试等领域有广泛的应用前景。